这硬盘是要坏了吗，谁会看这参数，才新买十多天

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这是一个创建于 3125 天前的主题，其中的信息可能已经有所发展或是发生改变。

[root@localhost ~]# smartctl --all /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.0-327.13.1.el7.x86_64] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model: WDC WD5003ABYZ-011FA0
Serial Number: WMAYP6462459
LU WWN Device Id: 0 000000 000000000
Firmware Version: 90.04R.9
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Tue May 3 20:12:18 2016 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (12000) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 140) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 175 166 051 Pre-fail Always - 7841
3 Spin_Up_Time 0x0027 148 148 021 Pre-fail Always - 3575
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 7
5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 5
7 Seek_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 469
10 Spin_Retry_Count 0x0033 100 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0032 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 7810
188 Command_Timeout 0x0032 100 099 000 Old_age Always - 1
190 Airflow_Temperature_Cel 0x0022 075 067 000 Old_age Always - 25
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 4
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 2
194 Temperature_Celsius 0x0022 118 110 000 Old_age Always - 25
195 Hardware_ECC_Recovered 0x0036 200 200 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 198 198 000 Old_age Always - 2
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 29
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0009 100 253 051 Pre-fail Offline - 0

SMART Error Log Version: 1
Warning: ATA error count 7810 inconsistent with error log pointer 1

ATA Error Count: 7810 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 7810 occurred at disk power-on lifetime: 469 hours (19 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 51 c9 a9 e0 Error: UNC 32 sectors at LBA = 0x00a9c951 = 11127121

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 b8 c9 a9 e0 08 19d+11:06:57.106 READ DMA
c8 00 08 28 ba a9 e0 08 19d+11:06:57.095 READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

4 条回复 • 2016-05-03 23:04:28 +08:00